World-Class Resources > Metrology Labs > Analytical & Characterization Techniques > Bruker D8 DISCOVER High Resolution X-ray Diffractometer

• Suitable for high angle XRD, low-angle XRR, and both bulk and thin film powder diffraction.
• Source: Cu (Ka) radiation at 1.54 Angstroms
• Sample stage: UMC 300 five-axis (x-y-z-χ-φ) precision sample stage, capable of handling 300mm wafers with full-wafer mapping

Typical applications: XRR for thin film structure – thickness, density, roughness; high resolution diffraction analysis of bulk and thin-film single crystal materials; polycrystalline thin film powder diffraction

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