World-Class Resources > Metrology Labs Advances in the development of technologies and devices - semiconductors, optoelectronics, MEMS, nano-technology - require very powerful thin film and material characterization techniques. To this end, CNSE has established a comprehensive characterization laboratory with several advanced analytical capabilities in support of its projects.

CNSE's Nanoscale Metrology and Imaging Center offers its analytical capability and expertise to its Technology Development Partners that are hosted on campus (IBM, International SEMATECH, TEL, etc.) The Nanoscale Metrology and Imaging Center also provides its characterization expertise to third parties with the objective to assist local and regional colleges, universities and companies in their research and development efforts.

For more information and inquiries, contact CNSE Assistant VP Metrology Steve Novak, snovak@albany.edu, or CNSE Characterization Lab Manager Richard Moore, rmoore@albany.edu.