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SEMI Northeast Forum
CNSE hosted the SEMI Northeast Forum on March 23. The event featured discussion of the International Technology Roadmap on Semiconductors (IRTS), with presentations from industry experts including CNSE faculty members Dr. Eric Eisenbraun, Associate Professor of Nanoscience, and Dr. Alain Diebold, Empire Innovation Professor of Nanoscale Science and Executive Director of the Center for Nanoscale Metrology. Key areas touched on EUV lithography, contamination, metrology and 3D test.
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