About Us > Faculty & Staff > Faculty > Richard Moore Manager of Analytical Facilities; Senior Scientist; Instructor

Watch Richard Moore's "Inside CNSE" video interview on the capabilities of an X-ray photoelectron spectrometer

Professional Background:

• Manager of Analytical Facilities; Senior Scientist; Instructor, CNSE (2000-present)
• Senior Analyst, Auger Electron Spectroscopy, Evans East Analytical Laboratory (1991-00)
• Senior Scientist/Laboratory Manager, Perkin-Elmer, Physical Electronics Division (1981-91)
• Engineering Assistant, Surface Science Group, Princeton University Plasma Physics Laboratory (1974-81)
• Graduate studies, Ceramic Engineering, Rutgers University (1982-84)
• B.A. Education, Trenton State College (1973)

Professional Experience:

• Development of vacuum and plasma-wall diagnostics for large-scale thermonuclear fusion test reactor.
• Determination of the outgassing properties of several fusion reactor materials.
• Design and control experiments in impurity generation and transport in magnetically confined plasmas.
• Measurement of sticking coefficient of CO on Al-Zr at room temperature.
• Performance of experiments to show relationship between sintering temperature, morphology and transition temperature in YBa2Cu3O7 HTSC.

Selected Achievements:

• Guest lecturer, University of Wisconsin-Milwaukee Center for Continuing Engineering Education
• Past chairman of the Analytical Instruments and Techniques Division of the American Society for Materials
• Contributing author, ASM Handbook, Volume 10, "Materials Characterization"

Patents:

U.S. Patent #4,414,244, "Carbon Coating by Electrophoresis for Controlling Metal Surface Effects," issued November 8, 1983 (with J. Timberlake, D. Ruzic, S. A. Cohen and Dennis Manos)

Selected Publications:

"Surface oxidation of carbon supports due to potential cycling under PEM fuel cell conditions", Bharat Avasarala, Richard Moore, Pradeep Haldar, ElectroChemica Acta, in press 10.1016/j.electacta.2010.03.056 (2010).

"In0.53Ga0.47As based metal oxide semiconductor capacitors with atomic layer deposition ZrO2 gate oxide demonstrating low gate leakage current and equivalent oxide thickness less than 1 nm", S. Koveshnikov, N. Goel, P. Majhi, H. Wen, M. B. Santos, S. Oktyabrsky, V. Tokranov, R. Kambhampati, R. Moore, F. Zhu, J. Lee and W. Tsai, Applied Physics Letters 92, 222904 (2008).

"Stabilization of Mesoporous Silica Films Using Multiple Organosilanes", Binay Singh, Darshan Gandhi, Amit Singh, Richard Moore, G. Ramanath, Applied Physics Letters, 92, 113516 (2008).

"Thermal Stability of Molecularly-Functionalized Mesoporous Silica Thin Films", A. P. Singh, D. D. Gandhi, R. Moore, and G. Ramanath, J. Applied Physics, 102, 044057 (2007).

"The Effect of Surface Contamination on High Resolution X-Ray Reflectometry Analyses of Si-Ge Layers", R.. J. Matyi and R. L. Moore, submitted to J. Thin Solid Films. (2007).

"Fracture Pathways in Organosilane-functionalized Mesoporous Silica Thin Films", Darshan D. Gandhi, Amit P. Singh, R. Moore, Eva E. Simonyl, Michael W. Lane, G. Ramanath, J. MRS Proc. Spring, 2007.

"Pore-Surface-Functionalization-Induced Enhancement of Elastic Properties and Thermal Stability of Mesoporous Silica Thin Films", A. P. Singh, D. D. Gandhi, R. Moore, E. E. Simonyi, E. G. Liniger, M. W. Lane, G. Ramanath, J. MRS Proc., Spring, 2007.

"Low-Temperature Titanium-Based Wafer Bonding: Ti/Si, Ti/SiO2, and Ti/Ti," Jian Yu, Yinmin Wang, Richard L. Moore, Jian-Quiang Lu, and Ronald J. Gutman, J. Electrochemical Society, 154 (1), (2007)

"Hot Electron Transport across Manganese Silicide Layers on the Silicon (001) Surface," A. J. Stollenwerk, M. R. Krause, R. Moore and V. LaBella, JVST, A, Vol. 24, 4, Jul/Aug. (2006)

"Ballistic Electron Transport of Fe-based Films on Si (001)," A. J. Stollenwerk, M. R. Krause, D. H. Idell, R. Moore and V. LaBella, JVST, B, Vol. 24, 4, Jul/Aug. (2006)

"Probing the Hot Electron Transport Properties and Interface Band Structure of Fe/Si (001) and Fe81C19 Si (001) Schottky Diodes," A. J. Stollenwerk, M. R. Krause, D. H. Idell. R. Moore and V. LaBella, Phys. Rev. B, 74, 155328, (2006)

"Nitrogen-implanted Silicon Oxynitride: A Coating for Suppressing Field-Emission From Stainless Steel Used in High-Voltage Applications," N. Theodore, B. C. Holloway, D. Manos, R. Moore, C. Hernandez, T. Wang, and H. F. Dylla, IEEE Transactions on Plasma Science, 34, 4, August (2006)

"Laser Assisted Molecular Beam Deposition of Thin Films for Gate Dielectrics Applications," R. L. DeLeon, J. F. Garvey, G. S. Tompa, R. Moore and H. Efstathiadis, Mat. Res. Soc. Symp. Proc. 768, 93 (2003)

"Formation of Defects in MBE Re-Grown GaAs Films on GaAs/AlGaAs Heterostructures," M. Lamberti, V. Tokranov, R. Moore, M. Yakimov, A. Katsnelson and S. Oktyabrsky, MRS Proc., Dec. (2002)

"FIB-Assisted Pt Deposition for Carbon Nanotube Integration and 3-D Nanoengineering," K. Dovidenko, J. Rullan, K. Dunn, R. Moore, F. Heuchling, MRS Proc., Dec. (2002)

"InAs Intermixing with Substate Layers During Formation of Quantum Dots," Michael Yakimov, R. Moore, V. Tokranov and S. Oktyabrsky, MRS Proc., Dec. (2002)

"Characterization of Plasma Source Ion Implanted Stainless Steel for High Voltage Applications," N.D. Theodore, Carlos Hernandez, Dennis Manos, H. Frederick Dylla, Richard Moore, Timothy Siggins, JVST (2002)

"Co-implantation of Carbon and Nitrogen into Silicon Dioxide for Synthesis of Carbon Nitride Materials," M. B. Huang, J. Liu, G. Nuesca, R.L. Moore, NIMB, B 196, 75-80 (2002)

"Oxide Thickness Determination by XPS, AES, RBS, SIMS and TEM," R. L. Moore, et al., JVST, B, (18) 1, 79-82, (2000)

"Comparative Analysis of Razor Blade Coatings Using Auger Electron Spectroscopy," R. L. Moore, Thin Solid Films, (1995)

"Investigation of Sn Diffusion in Au Contacts by Auger Electron Spectroscopy," R. L. Moore, SAMPE-ISHM Proc., June (1994)

"Effects of Oxygen and Substrate Additives on Gas-Metal Eutectic Direct Bonding of Copper and Alumina," W. L. Chiang, V. A. Greenhut, D. J. Shanefield, L. A. Johnson, and R. L. Moore, J. Am. Cer. Soc., (1993)

"Analysis of Plasma-oxidized Hg1-xCdxTe Surfaces," P. W. Leech, R. L. Moore, E. E. Crisman, C. B. Roberts, and P. J. Stiles, MRS Proc., Spring, (1992)

"High Temperature Inter-diffusion Investigations of Titanium Nitride and Aluminum Oxide on Silicon Carbide Fibers," K. Pourrezaei, R. S. Rastogi, H. M. Chou, M. Ihsan, and R. L. Moore, Thin Solid Films, (1991)

"AES and XPS Study of Surface Heterogeneity in ASTM F-75 Alloy Prepared for Biomedical Implantation," R. L. Moore, G. L. Grobe, III, and J. A. Gardella, JVST, A9 (3), 1323-1328, May-June (1991)

"Effects of Air Oxidation on Phase Distribution in HfB2 + 25 v/o SiC + 10 v/o Al as determined by Scanning Auger Microscopy," R. L. Moore, G. W. Hunter, and A. Mishra, Proc. Second International Ceramic Science and Technology Congress, Nov. (1990)

"Investigation of the Correlation Between Surface Properties and Surface Chemistry of Electroless Nickel Coatings," R. L. Moore and L. Salvati, Jr., Thin Solid Films, 193/194, 270-279, (1990)

"AES Study of Composition and Microstructure of SiC Sintered with Rare-Earth Oxides," R. L. Moore and L. Cordrey, Ceramic Engineering and Science Proceedings, 13th Annual Conference of Composites and Ceramic Materials, 10 (7-8), 976-985, (1989)

"Evaluation Methods and Evaporation Conditions for Low-Resistivity Contacts on High Tc Superconductors," Y. P. Liu, K. Warner, C. Chen, K., Chen, R. Mankiewicz, and R. L. Moore, J. Appl. Phys., 66 (11), 5514, December (1989)

"Evaluating Precursor Processing of Ba2YCu3O7-x Compounds Using High Resolution Scanning Auger Microscopy," R. L. Moore, Surf. and Interface Anal., 14 (1 & 2), 23-27 (1989)

"CW Laser Etching of Ba2YCu3O7 Films," G. W. Fasanick, D. Brasen, R. Opila, P. Mankiewich, W. Skocpol, R. E. Howard, M. Hong, H. M. O'Brien, and R. L. Moore, MRS Proc., (1987)

"On the Defect Structure of Grain Boundaries in Ba2YCu3O7-x," G. J. Fasanick, S. Nakahara, M. F. Yan, T. Boone, R. B. vanDover, and R. L. Moore, J. Crystal Growth, (1987)

"Microstructural Characterization of Ba2YCu3O7 Films Produced by E-Beam Evaporation," P. Mankiewich, W. Skocpol, R. E. Howard, A. Dayem, G. J. Fasanick, R. J. Fleming, A. E. White, S. H. Liou, and R. L. Moore, Phys. Rev. Lett., November (1987)